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 Scanning Electron Microscope (SEM)


Sirris can perform scanning electron microscope tests for structural and dimensional analyses. This technique helps to detect faults in products or to analyse the surface structure.

Can be applied to:
Metals, coatings, composites, adhesives, 3D printed parts, plastics

Test method standards:

Test procedure:

The SEM is an electronic microscope capable of taking high resolution images of the surface of a sample.

The technique also offers the possibility of dimensional measurements such as particle or fiber diameter, layer thickness, etc.

Sample preparation is often required to allow a good evaluation. Sirris can offer this service.

Lead time:
1 business day

All tests – composites – metals – plastics – coatings – adhesives – 3D prints

About Sirris Testlabs

Since 1949, Sirris has been helping companies in Belgium to innovate. With our high-tech testing labs and our skilled material experts we want to support the Belgian manufacturing industry in testing and improving its products.

A division of

Accreditation acc to EN ISO 17025






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